November 24, 2017

Educational Scanning Tunneling Microscope (STM)

 
   
 

With the support of the Ministry of Science, Education and Sports of the Republic of Croatia for the scientific Project 0069-028 entitled “Theoretical and experimental analysis of ultra-high precision flexural hinges” (2005 – 2006), a NanosurfEasyScan E-STM educational scanning tunneling microscope was purchased.  Its characteristics are the following:

 

 
  • XY scanning area:  500 nm.
  • Maximum Z displacement: 200 nm.
  • Resolution of height adjustment: 0,003 nm (3 pm).
  • Resolution of other motions: 0,015 nm (15 pm).
  • Gap voltage: ± 10 V in 5 mV steps.
  • Current: ± 100 nA in 25 pA increments.
  • Max sample size: 10 mm.
  • Maximum scanning speed: 1800 points per second.
  • Feedback bandwidth: 3 kHz.
  • Scanning tip: 0,25 mm Pt/Ir wire.
  • Measurement mode: constant current or constant distance.
  • Vibration isolated stand.
  • EasyScan E-line software for visualization of measurement data (Line graph, Colour map, 3D view, …).
  • Portable suitcase.